IST 2013 Home


Click here to view the IEEE International School of Imaging Lectures.

Following the success of events in Stresa in Italy 2004, Niagara Falls in Canada 2005, Minori in Italy 2006, Krakow in Poland 2007, Chania in Greece 2008, Shenzhen in China 2009, Thessaloniki in Greece 2010 Penang in Malaysia 2011 and Manchester in the UK 2012, the 2013 IEEE International Conference on Imaging Systems and Techniques (IST’2013) will take place in Beijing, China.

IST’2013 deals with the design, development, evaluation and applications of imaging systems, instrumentation, and measuring techniques, to enhance detection and image quality. Applications for aerospace, medicine and biology, molecular imaging, metrology, Ladars and Lidars, radars, homeland security, and industrial imaging, with emphasis on industrial and medical tomography, corrosion imaging, and non-destructive evaluation (NDE), will be covered. The following areas will be particularly considered:

  • Aerospace imaging
  • Remote sensing, passive and active sensing 
  • Ladars and Lidars
  • Polarimetric Imaging
  • Multi-spectral polarimetric imaging and Lasers 
  • Medical Imaging
  • Computer Tomography (CT), Single Photon Emission Tomography (SPECT)
  • Positron Emission Tomography (PET), Magnetic Resonance Imaging (MRI)
  • Molecular and metabolic imaging
  • Cancer detection and imaging of margins
  • Electric Impedance Tomography
  • Environmental monitoring, energy resources
  • Real-time imaging and video processing
  • Subsurface inspection, corrosion imaging
  • Airport security and cargo inspection 
  • Electromagnetic imaging and inverse scattering
  • Image analysis and processing
  • Pattern recognition and feature extraction
  • Image transformations
  • Statistical description of images
  • Wavelets and fractals
  • Image enhancement and restoration
  • Image segmentation and edge detection
  • Image processing for multispectral images

With emphasis on: 

  • Detector design principles and image formation
  • Imaging system design and instrumentation 
  • Signal and image analysis
  • Pre-processing and post-processing 
  • Multi-functional and multi-fusion imaging 
  • Emerging trends on imaging